China targets chip, quantum advances with 2030 metrology action plan in tech race with US
Plan aims to tackle several ‘pain points’ or shortcomings in China’s metrological capabilities, official Science and Technology Daily says
The 2030 action plan, released by the State Administration for Market Regulation, focuses on breakthroughs in chip technology and quantum-scale measurement, both critical to a wide range of industries.
According to a report by ministry newspaper Science and Technology Daily last week, the plan targets tackling several “pain points” or shortcomings in China’s metrological capabilities, including measurement capabilities that are missing or need to be improved.
As metrology is the foundation for all industries dependent on precise and dependable measurements, the expansion of such capabilities is a strategic priority for both countries.
“By 2030, basic metrology capabilities will be comprehensively improved, with key breakthroughs in more than 50 key core technologies of metrology,” the Chinese action plan released on May 16 says.